Invention Application
US20140080230A1 APPARATUS AND METHOD FOR EVALUATING OPTICAL PROPERTIES OF LED AND METHOD FOR MANUFACTURING LED DEVICE
审中-公开
用于评估LED的光学特性的装置和方法以及用于制造LED器件的方法
- Patent Title: APPARATUS AND METHOD FOR EVALUATING OPTICAL PROPERTIES OF LED AND METHOD FOR MANUFACTURING LED DEVICE
- Patent Title (中): 用于评估LED的光学特性的装置和方法以及用于制造LED器件的方法
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Application No.: US14057855Application Date: 2013-10-18
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Publication No.: US20140080230A1Publication Date: 2014-03-20
- Inventor: Jong Rak SOHN , Il Woo PARK
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2010-0010926 20100205; KR10-2010-0010927 20100205
- Main IPC: H01L21/66
- IPC: H01L21/66 ; H01L33/50
Abstract:
An optical property evaluation apparatus includes: a light conversion filter converting light emitted from an LED chip or a bare LED package, which is to be evaluated, into a different wavelength of light, and emitting a specific color of light; and an optical property measurement unit receiving the specific color of light emitted from the light conversion filter and measuring the optical properties of the received light.
Public/Granted literature
- US09190335B2 Apparatus and method for evaluating optical properties of LED and method for manufacturing LED device Public/Granted day:2015-11-17
Information query
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