Invention Application
- Patent Title: INSPECTION SYSTEM AND INSPECTION METHOD
- Patent Title (中): 检查系统和检查方法
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Application No.: US14136494Application Date: 2013-12-20
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Publication No.: US20140185763A1Publication Date: 2014-07-03
- Inventor: Zhiqiang CHEN , Yuanjing LI , Ziran ZHAO , Wanlong WU , Le TANG , Yinong LIU , Yingkang JIN , Guangwei DING , Shuo CAO , Zhimin ZHENG , Wenguo LIU , Wentao YU , Yi ZHOU
- Applicant: Tsinghua University , Nuctech Company Limited
- Applicant Address: CN Beijing CN Beijing
- Assignee: TSINGHUA UNIVERSITY,NUCTECH COMPANY LIMITED
- Current Assignee: TSINGHUA UNIVERSITY,NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing CN Beijing
- Priority: CN201210581760.7 20121227
- Main IPC: G01V5/00
- IPC: G01V5/00

Abstract:
An inspection system included a ray source to emit a ray, a detector to receive the ray, a detection region for placing an object under inspection, and a moving device to move the ray source and the detector around the detection region. Conventional scanning blind zones such as both sides of a human body, both sides of arms and both sides of legs can be completely eliminated. In addition, it is not necessary for a human body under inspection to carry out an action such as turning around to change his or her posture. Therefore, ineffective time can be minimized in the entire detection and a passing rate of persons under inspection can be improved. Furthermore, an inspected person's mental feeling of being controlled due to change of posture can be greatly improved, and his or her mental discomfort and conflicted moods can be reduced.
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