Invention Application
- Patent Title: SCANNING APPARATUS WITH PATTERNED PROBE LIGHT
- Patent Title (中): 扫描仪与图案探照灯
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Application No.: US14310248Application Date: 2014-06-20
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Publication No.: US20140376064A1Publication Date: 2014-12-25
- Inventor: Christian Romer ROSBERG , Bo ESBECH
- Applicant: 3Shape A/S
- Applicant Address: DK Copenhagen K
- Assignee: 3Shape A/S
- Current Assignee: 3Shape A/S
- Current Assignee Address: DK Copenhagen K
- Priority: DKPA201370344 20130621
- Main IPC: H04N1/029
- IPC: H04N1/029 ; H04N1/00

Abstract:
A 3D scanner for recording the 3D topography of an object, the 3D scanner includes an illumination unit configured for providing probe light for illuminating the object, where the probe light includes a pattern of light rays; an image sensor for acquiring one or more 2D images of light rays returning from the illuminated object; an optical system including an optical element arranged such that the patterned probe light passes through it when propagating towards the object from the illumination unit along an optical path; and a device for changing the configuration of the optical system between a first and a second configuration, where the change in configuration comprises a change in orientation of the optical element between a first orientation and a second orientation relative to the optical path of the probe light.
Public/Granted literature
- US09019576B2 Scanning apparatus with patterned probe light Public/Granted day:2015-04-28
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