Invention Application
US20140376064A1 SCANNING APPARATUS WITH PATTERNED PROBE LIGHT 有权
扫描仪与图案探照灯

  • Patent Title: SCANNING APPARATUS WITH PATTERNED PROBE LIGHT
  • Patent Title (中): 扫描仪与图案探照灯
  • Application No.: US14310248
    Application Date: 2014-06-20
  • Publication No.: US20140376064A1
    Publication Date: 2014-12-25
  • Inventor: Christian Romer ROSBERGBo ESBECH
  • Applicant: 3Shape A/S
  • Applicant Address: DK Copenhagen K
  • Assignee: 3Shape A/S
  • Current Assignee: 3Shape A/S
  • Current Assignee Address: DK Copenhagen K
  • Priority: DKPA201370344 20130621
  • Main IPC: H04N1/029
  • IPC: H04N1/029 H04N1/00
SCANNING APPARATUS WITH PATTERNED PROBE LIGHT
Abstract:
A 3D scanner for recording the 3D topography of an object, the 3D scanner includes an illumination unit configured for providing probe light for illuminating the object, where the probe light includes a pattern of light rays; an image sensor for acquiring one or more 2D images of light rays returning from the illuminated object; an optical system including an optical element arranged such that the patterned probe light passes through it when propagating towards the object from the illumination unit along an optical path; and a device for changing the configuration of the optical system between a first and a second configuration, where the change in configuration comprises a change in orientation of the optical element between a first orientation and a second orientation relative to the optical path of the probe light.
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