Invention Application
US20150097592A1 DIRECT TESTING FOR PERIPHERAL CIRCUITS IN FLAT PANEL DEVICES
审中-公开
用于平板设备中的外围电路的直接测试
- Patent Title: DIRECT TESTING FOR PERIPHERAL CIRCUITS IN FLAT PANEL DEVICES
- Patent Title (中): 用于平板设备中的外围电路的直接测试
-
Application No.: US14508425Application Date: 2014-10-07
-
Publication No.: US20150097592A1Publication Date: 2015-04-09
- Inventor: Chang Hee Lee , James Lee , Sung Jin Kim , Jongho Lee , Michael Sean Cassady , Nikolay Mokichev , Kent Nguyen , Daniel Toet
- Applicant: Photon Dynamics, Inc.
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G01R31/44
Abstract:
A method of testing a flat panel display including an array of pixels and a peripheral circuit configured to provide signals to the pixels is disclosed. The method includes applying at least one test signal to the peripheral circuit, acquiring one or more voltage images of the peripheral circuit, and detecting a defect in the peripheral circuit based on the acquired voltage images.
Information query
