Invention Application
US20150198516A1 VACUUM APPARATUS AND METHOD OF MONITORING PARTICLES 有权
真空装置和监测颗粒的方法

VACUUM APPARATUS AND METHOD OF MONITORING PARTICLES
Abstract:
A vacuum apparatus includes a vacuum chamber, first sensor units disposed in the vacuum chamber facing a deposition direction of particles, and second sensor units disposed in the vacuum chamber, each disposed on a corresponding first sensor of the first sensor units facing the deposition direction, wherein the first sensor units are configured to sense a pressure in the vacuum chamber and an absorption amount of the particles adsorbed to the first sensor units, and the second sensor units are configured to sense the pressure in the vacuum chamber.
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