Invention Application
- Patent Title: VACUUM APPARATUS AND METHOD OF MONITORING PARTICLES
- Patent Title (中): 真空装置和监测颗粒的方法
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Application No.: US14453228Application Date: 2014-08-06
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Publication No.: US20150198516A1Publication Date: 2015-07-16
- Inventor: Eun-Ju SONG , Hoonchul RYOO
- Applicant: Samsung Display Co., Ltd.
- Priority: KR10-2014-0004710 20140114
- Main IPC: G01N15/06
- IPC: G01N15/06 ; G01L11/04 ; G01N29/00

Abstract:
A vacuum apparatus includes a vacuum chamber, first sensor units disposed in the vacuum chamber facing a deposition direction of particles, and second sensor units disposed in the vacuum chamber, each disposed on a corresponding first sensor of the first sensor units facing the deposition direction, wherein the first sensor units are configured to sense a pressure in the vacuum chamber and an absorption amount of the particles adsorbed to the first sensor units, and the second sensor units are configured to sense the pressure in the vacuum chamber.
Public/Granted literature
- US09897526B2 Vacuum apparatus and method of monitoring particles Public/Granted day:2018-02-20
Information query