An apparatus may include one or more registers configured to store a plurality of values, and an analog-to-digital converter (ADC). Each value of the plurality of values may correspond to a characteristic of a transistor at a respective temperature value. The ADC may be configured to generate a digital value corresponding to a difference in voltage levels between a first terminal and a second terminal of the transistor. The apparatus may further include a sensor configured to measure a temperature, and control logic configured to generate a first voltage level at a control terminal of the transistor and receive the digital value from the ADC. The control logic may be further configured to determine, during a first operational mode, a current passing through the transistor dependent upon the digital value, at least one value of the plurality of values, and the temperature.