Invention Application
- Patent Title: MULTI-ANGLE SPECTRAL IMAGING MEASUREMENT METHOD AND APPARATUS
- Patent Title (中): 多角度光谱成像测量方法和装置
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Application No.: US15265816Application Date: 2016-09-14
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Publication No.: US20170010158A1Publication Date: 2017-01-12
- Inventor: Masayuki Osumi
- Applicant: OFFICE COLOR SCIENCE CO., LTD.
- Applicant Address: JP Kumamoto-shi
- Assignee: OFFICE COLOR SCIENCE CO., LTD.
- Current Assignee: OFFICE COLOR SCIENCE CO., LTD.
- Current Assignee Address: JP Kumamoto-shi
- Priority: JP2012-097170 20120420; JP2012-126389 20120601
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/42 ; G01J3/52 ; G01J3/12 ; G01N21/25 ; G01N21/27 ; G01N21/57 ; G01J3/02 ; G01J3/46

Abstract:
A lighting device that emits illumination light from two or more angular directions onto a sample surface to be measured, an imaging optical lens, and a monochrome two-dimensional image sensor are provided. This configuration provides a method and an apparatus that take a two-dimensional image of the sample surface to be measured at each measurement wavelength and accurately measure multi-angle and spectral information on each of all pixels in the two-dimensional image in a short time. In particular, a multi-angle spectral imaging measurement method and apparatus that have improved accuracy and usefulness are provided.
Public/Granted literature
- US09823130B2 Multi-angle spectral imaging measurement method and apparatus Public/Granted day:2017-11-21
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