Invention Application
- Patent Title: A METHOD OF DETECTING A DEFECT LIGHT SENSOR
- Patent Title (中): 检测缺陷光传感器的方法
-
Application No.: US15121789Application Date: 2015-02-16
-
Publication No.: US20170016761A1Publication Date: 2017-01-19
- Inventor: THEODORUS JACOBUS JOHANNES DENTENEER
- Applicant: PHILIPS LIGHTING HOLDING B.V.
- Assignee: Philips Lighting Holding B.V.
- Current Assignee: Philips Lighting Holding B.V.
- Priority: EP14156800.6 20140226
- International Application: PCT/EP2015/053211 WO 20150216
- Main IPC: G01J1/02
- IPC: G01J1/02 ; G01J1/42

Abstract:
A method of detecting a defect light sensor, includes the operations of:—collecting data, comprising collecting light sensor data;—performing a preparation procedure on the collected data in order to determine a template; and—performing a detection procedure for determining a light sensor status. The operation of performing a preparation procedure includes determining a template of the behavior of the light sensor data collected during a time period constituting a part of a day with well-defined conditions The operation of performing a detection procedure includes the operations of:—collecting light sensor data for several further days during the corresponding time period;—selecting representative days thereof;—determining a corresponding behavior for each selected day; and—comparing the corresponding behavior with the template to detect any defect of the light sensor.
Information query