Invention Application
- Patent Title: GAS ANALYSIS METHOD AND GAS ANALYSIS DEVICE
- Patent Title (中): 气体分析方法和气体分析装置
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Application No.: US15125092Application Date: 2015-09-24
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Publication No.: US20170016816A1Publication Date: 2017-01-19
- Inventor: Shigeyuki TAKAGI , Tsutomu KAKUNO , Yasutomo SHIOMI , Akira MAEKAWA , Miyuki KUSABA , Hiroshi HASEGAWA , Takashi MAGARA
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Priority: JP2015-022683 20150206
- International Application: PCT/JP2015/076995 WO 20150924
- Main IPC: G01N21/3504
- IPC: G01N21/3504 ; G01N33/497 ; G01N21/39

Abstract:
A gas analysis method includes irradiating a sample gas introduced into a gas cell with infrared light tuned to a wavelength corresponding to one absorption line of a target gas contained in the sample gas, measuring a sample signal value corresponding to intensity of transmitted light of the infrared light transmitted through the gas cell, evacuating the sample gas in the gas cell and then replacing by a reference gas, measuring a reference signal value corresponding to intensity of transmitted light of the infrared light transmitted through the reference gas, and calculating gas concentration at the one absorption line from ratio of the sample signal value to the reference signal value.
Information query
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