Invention Application
- Patent Title: ANALYSIS METHOD AND ANALYZER
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Application No.: US15608288Application Date: 2017-05-30
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Publication No.: US20170345148A1Publication Date: 2017-11-30
- Inventor: Sayuri TOMODA , Nobuhiro KITAGAWA , Jianyin LU , Kosuke JITSUHARA
- Applicant: Sysmex Corporation
- Priority: JP2016-109627 20160531
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G01V8/10 ; G01N33/543 ; G01N21/64 ; G01N35/00 ; G01B11/24 ; G01N21/76 ; H04N7/18 ; G01N21/03

Abstract:
Disclosed is an analysis method for detecting and analyzing light from a sample prepared so as to emit light in accordance with an amount of a test substance, the analysis method including taking an image of a storage member configured to store the sample therein; switching a state of a reflector to a state in which light from the sample is reflected toward a light detection unit and detecting light from the sample by the light detection unit; and outputting an analysis result of the sample on the basis of a light amount detected by the light detection unit.
Public/Granted literature
- US10672121B2 Analysis method and analyzer Public/Granted day:2020-06-02
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