Invention Application
- Patent Title: CHARACTERIZING THE EMISSION PROPERTIES OF SAMPLES
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Application No.: US15838880Application Date: 2017-12-12
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Publication No.: US20180172600A1Publication Date: 2018-06-21
- Inventor: Joachim Wietzorrek
- Applicant: Roche Diagnostics Operations, Inc.
- Applicant Address: US IN Indianapolis
- Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee: Roche Diagnostics Operations, Inc.
- Current Assignee Address: US IN Indianapolis
- Priority: EP16204804.5 20161216
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G02B17/08 ; G03F7/20

Abstract:
The present disclosure relates to a method for characterizing a light source. The method includes providing a light source to be characterized, collecting light emitted from the light source by using imaging optics, the imaging optics generating a pupil of the collected light emitted from the light source, generating an image of a pupil of light emitted only from a first surface area of the light source at a detector using the imaging optics, laterally shifting the light source and the imaging optics relative to each other and after the lateral shift, generating an image of a pupil of light emitted only from a second surface area of the light source at the detector using the imaging optics. The imaging optics includes a field stop between the light source and the detector to select a portion of the light source's surface from which light is imaged at a time.
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