Invention Application
- Patent Title: COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY
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Application No.: US16925420Application Date: 2020-07-10
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Publication No.: US20220011091A1Publication Date: 2022-01-13
- Inventor: Andrew N. Acker , Jacob D. Garan
- Applicant: BAE Systems Information and Electronic Systems Integration Inc.
- Applicant Address: US NH Nashua
- Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee Address: US NH Nashua
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01B11/16

Abstract:
A method and apparatus for performing shearography where the shear length and direction can be set in image processing, thus allowing all shear sizes to be computed and tested from a single data set, which can be collected in a single pass over a test surface or test object. The present process assures that a single data set can be processed with optimal shear length for multiple target types, thus reducing or eliminating the chance of missing a target detection while additionally enhancing target shape analysis by allowing the calculation of target response versus shear length and shear direction.
Information query