Invention Application
- Patent Title: ANOMALY DETECTION APPARATUS, ANOMALY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
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Application No.: US17431263Application Date: 2019-02-22
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Publication No.: US20220129764A1Publication Date: 2022-04-28
- Inventor: Satoshi IKEDA
- Applicant: NEC Corporation
- Applicant Address: JP Minato-ku, Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Minato-ku, Tokyo
- International Application: PCT/JP2019/006776 WO 20190222
- Main IPC: G06N5/00
- IPC: G06N5/00 ; G06K9/62

Abstract:
An anomaly detection apparatus according to the present disclosure includes a binary tree structure creation unit, a score calculation unit, and a learning unit. The binary tree structure creation unit creates a binary tree structure using a plurality of data pieces. The score calculation unit calculates a score using a node evaluation value for a node feature vector, the node feature vector being a feature of each node passing from a root node to a leaf node of the binary tree structure. The learning unit learns a node evaluation model for calculating the node evaluation value for the node feature vector of the each node of the binary tree structure.
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06N | 基于特定计算模型的计算机系统 |
G06N5/00 | 利用基于知识的模式的计算机系统 |