• Patent Title: ANOMALY DETECTION APPARATUS, ANOMALY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
  • Application No.: US17431263
    Application Date: 2019-02-22
  • Publication No.: US20220129764A1
    Publication Date: 2022-04-28
  • Inventor: Satoshi IKEDA
  • Applicant: NEC Corporation
  • Applicant Address: JP Minato-ku, Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Minato-ku, Tokyo
  • International Application: PCT/JP2019/006776 WO 20190222
  • Main IPC: G06N5/00
  • IPC: G06N5/00 G06K9/62
ANOMALY DETECTION APPARATUS, ANOMALY DETECTION METHOD, AND COMPUTER-READABLE MEDIUM
Abstract:
An anomaly detection apparatus according to the present disclosure includes a binary tree structure creation unit, a score calculation unit, and a learning unit. The binary tree structure creation unit creates a binary tree structure using a plurality of data pieces. The score calculation unit calculates a score using a node evaluation value for a node feature vector, the node feature vector being a feature of each node passing from a root node to a leaf node of the binary tree structure. The learning unit learns a node evaluation model for calculating the node evaluation value for the node feature vector of the each node of the binary tree structure.
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