Invention Application
- Patent Title: METHOD FOR STATISTICAL DISTRIBUTION CHARACTERIZATION OF DENDRITIC STRUCTURES IN ORIGINAL POSITION OF SINGLE CRYSTAL SUPERALLOY
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Application No.: US17586729Application Date: 2022-01-27
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Publication No.: US20220252488A1Publication Date: 2022-08-11
- Inventor: DONGLING LI , LEI ZHAO , HAIZHOU WANG , XUEJING SHEN , QINGQING ZHOU , WEIHAO WAN , HAOZHOU FENG
- Applicant: NCS TESTING TECHNOLOGY CO., LTD , CENTRAL IRON AND STEEL RESEARCH INSTITUTE
- Applicant Address: CN BEIJING; CN BEIJING
- Assignee: NCS TESTING TECHNOLOGY CO., LTD,CENTRAL IRON AND STEEL RESEARCH INSTITUTE
- Current Assignee: NCS TESTING TECHNOLOGY CO., LTD,CENTRAL IRON AND STEEL RESEARCH INSTITUTE
- Current Assignee Address: CN BEIJING; CN BEIJING
- Priority: CN202110165083X 20210206
- Main IPC: G01N1/28
- IPC: G01N1/28 ; G01N23/223 ; G01N33/204

Abstract:
The present application relates to a method for statistical distribution characterization of dendritic structures in original position of single crystal superalloy, and relates to the technical field of analysis of metal material composition and microstructure, comprising the following steps: step 1, processing a to-be-tested sample and determining a calibration coefficient; step 2, obtaining a two-dimensional element content distribution map of the to-be-tested sample; and step 3, determining the number and average spacing of primary dendrites. A composition distribution region analyzed in the present application is larger than the area of a distribution region of the traditional microscopic analysis method, and the sample preparation is simple. The distribution, number and average spacing of the primary dendrites can be obtained without metallographic corrosion sampling. Therefore, the present invention has the advantages of large statistical field of view, high efficiency and complete information, and the statistical data is more accurate and reliable.
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