Invention Application
- Patent Title: DISPLAY METHOD AND SPECIMEN ANALYSIS DEVICE
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Application No.: US17681389Application Date: 2022-02-25
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Publication No.: US20220277500A1Publication Date: 2022-09-01
- Inventor: Yuji Masuda , Tetsuya Kaneko
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Priority: JP2021-030969 20210226
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G06T19/00 ; G06F3/04847

Abstract:
Disclosed is a method for displaying a result of analysis performed on a specimen containing formed components. The method includes: obtaining, from each of the formed components, measurement values of at least three parameters; displaying a screen including a three-dimensional distribution chart in which the three parameters are used as axes and the formed components are represented by dots; and hiding specific dots on the three-dimensional distribution chart or changing a display format of the specific dots, according to an operation performed by a user.
Information query