Invention Application
- Patent Title: System for Monitoring a Device
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Application No.: US17721496Application Date: 2022-04-15
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Publication No.: US20220333992A1Publication Date: 2022-10-20
- Inventor: Ralf Gitzel , Joerg Gebhardt , Joerg Ostrowski , Maciej Mruczek , Anastasios Papageorgiou
- Applicant: ABB Schweiz AG
- Applicant Address: CH Baden
- Assignee: ABB Schweiz AG
- Current Assignee: ABB Schweiz AG
- Current Assignee Address: CH Baden
- Priority: EP21169360.1 20210420
- Main IPC: G01J5/00
- IPC: G01J5/00 ; H04N5/33 ; G01J5/02

Abstract:
A system and method includes an infrared camera; a processing unit; and an output unit. The infrared camera is configured to acquire a plurality of infrared images of the device, wherein the plurality of infrared images comprises a first infrared image and a second infrared image acquired a time period after the first infrared image. The processing unit is configured to determine a pixel in the first infrared image with a hottest temperature and determine a pixel in the second infrared image with a hottest temperature. The processing unit is configured to determine a first number of pixels in the first infrared image that have a temperature within a threshold temperature of the hottest temperature of the first infrared image and determine a second number of pixels in the second infrared image that have a temperature within the threshold temperature of the hottest temperature of the second infrared image.
Public/Granted literature
- US12044576B2 System for monitoring a device Public/Granted day:2024-07-23
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