Invention Publication
- Patent Title: SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE
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Application No.: US18159794Application Date: 2023-01-26
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Publication No.: US20230168277A1Publication Date: 2023-06-01
- Inventor: Scott E. Lindsey , Junjye Yeh , Jovan Jovanovic , Seang P. Malathong
- Applicant: AEHR TEST SYSTEMS
- Applicant Address: US Fremont
- Assignee: AEHR TEST SYSTEMS
- Current Assignee: AEHR TEST SYSTEMS
- Current Assignee Address: US Fremont
- The original application number of the division: US16511816 2019.07.15
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R31/28 ; G01R1/067 ; G01R31/26 ; G01R1/073

Abstract:
A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.
Public/Granted literature
- US11977098B2 System for testing an integrated circuit of a device and its method of use Public/Granted day:2024-05-07
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