The present application relates to a testing method for a packaged chip, a testing system for a packaged chip, a computer device and a storage medium. The method includes following steps: acquiring a target chip; in the post-burn-in test process, testing a first data retention time of each memory unit on the target chip; comparing the first data retention time of each memory unit with a preset reference time; and, determining that the target chip is a qualified chip if the first data retention time of each memory unit is not less than the preset reference time. In the present application, by testing the first data retention time of each memory unit on the target chip in the post-burn-in test process, it is determined that the target chip is a qualified chip if the first data retention time of each memory unit is not less than the preset reference time, and subsequent testing will be performed continuously. Moreover, since the products satisfying the requirements can be screened out in the bum-in test process, compared with the prior art, the test cost is reduced, and the test efficiency is improved.