Invention Publication
- Patent Title: TEST DEVICE FOR MEASURING SYNCHRONIZATION ERRORS BETWEEN CLUSTERS IN A CELLULAR NETWORK
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Application No.: US17552146Application Date: 2021-12-15
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Publication No.: US20230189170A1Publication Date: 2023-06-15
- Inventor: Jong-Min KIM , Young-Kill Kim , Hyuck-In Kwon , Yoo-Chul Shin , Jae-Gab Lee
- Applicant: VIAVI SOLUTIOS INC.
- Applicant Address: US CA San Jose
- Assignee: VIAVI SOLUTIONS INC.
- Current Assignee: VIAVI SOLUTIONS INC.
- Current Assignee Address: US CA San Jose
- Main IPC: H04W56/00
- IPC: H04W56/00 ; H04W4/021 ; H04W24/08 ; G01S19/13

Abstract:
A test device may be a portable test device that can perform over the air measurements to determine synchronization errors between clusters in a cellular network. The test device can generate a graphical user interface that can show a map of the boundary area between clusters, locations of base stations in the boundary area, locations where over the air measurements were taken by the test device, an indication of whether cells are in synchronization for each measurement location, and a table of actual measurements and derived parameters pertaining to cell phase synchronization, interference and other performance metrics.
Public/Granted literature
- US11871366B2 Test device for measuring synchronization errors between clusters in a cellular network Public/Granted day:2024-01-09
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