An anomaly detection system may be configured for an embedded device, such as a microcontroller. The anomaly detection system may be configured to receive a dataset from a sensor, such as a camera, a microphone, or an inertial management unit. The anomaly detection system may extract a plurality of features from the dataset. The plurality of features may be configured to train a neural network model, such as a convolutional classifier, to generate one or more classifications. The anomaly detection system may generate an anomaly score based on the plurality of features. The anomaly detection system may trigger an output based on the anomaly score exceeding a range.