Invention Publication
- Patent Title: OPHTHALMOLOGIC APPARATUS AND METHOD OF EXAMINING EYE TO BE EXAMINED
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Application No.: US18283586Application Date: 2022-02-17
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Publication No.: US20240156339A1Publication Date: 2024-05-16
- Inventor: Hiroaki OKADA , Yoko TATARA
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP 21059896 2021.03.31
- International Application: PCT/JP2022/006301 2022.02.17
- Date entered country: 2023-09-22
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/103 ; A61B3/107

Abstract:
An ophthalmologic apparatus includes a first left eye measurement optical system for measurement of dimensional information in a front-back direction of a left eye, a second left eye measurement optical system for measurement of a corneal shape of the left eye, a third left eye measurement optical system for measurement of a refractive property of the left eye, a first right eye measurement optical system for measurement of dimensional information in a front-back direction of a right eye, a second right eye measurement optical system for measurement of a corneal shape of the right eye, a third right eye measurement optical system for measurement of a refractive property of the right eye, and a control unit to control the first, second and third left eye measurement optical systems and the first, second and third right eye measurement optical systems.
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