Invention Grant
- Patent Title: Wide angular range X-ray diffraction reference standard composite
- Patent Title (中): 宽角度范围X射线衍射参考标准复合材料
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Application No.: US382016Application Date: 1982-05-26
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Publication No.: US4385095APublication Date: 1983-05-24
- Inventor: Ronald Jenkins
- Applicant: Ronald Jenkins
- Applicant Address: NY New York
- Assignee: North American Philips Corporation
- Current Assignee: North American Philips Corporation
- Current Assignee Address: NY New York
- Main IPC: G01N23/207
- IPC: G01N23/207 ; G01N1/00 ; G01N1/28 ; G01N23/20 ; G21K1/06 ; B32B9/04
Abstract:
A unique composite structure is provided for calibration of diffractometer at low values of 2.theta.. This composite structure involves a layer of silicon powder and a plurality of monolayers of a heavy metal stearate on the silicon powder. A lead stearate layered material has been found to provide significant results for enabling calibration below 20.degree..
Public/Granted literature
- US6075614A System for generating proof Public/Granted day:2000-06-13
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