Invention Grant
- Patent Title: Ion implanter with post mass selection deceleration
- Patent Title (中): 离子注入机,后质量选择减速
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Application No.: US860748Application Date: 1997-09-08
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Publication No.: US5969366APublication Date: 1999-10-19
- Inventor: Jonathan Gerald England , Stephen Moffatt , David George Armour , Majeed Foad
- Applicant: Jonathan Gerald England , Stephen Moffatt , David George Armour , Majeed Foad
- Applicant Address: CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: CA Santa Clara
- Priority: GBX9522883 19951108; GBX9616240 19960801
- Main IPC: H01J37/05
- IPC: H01J37/05 ; H01J37/30 ; H01J37/317
Abstract:
A post mass selection decel lens (9) is located between the exit aperture (55) of the mass selection chamber (47) and the entry (74) to the electron confinement tube (69) of the PFS. The lens comprises a first electrode (65) at the substrate potential, a second electrode (60) at the flight tube potential, and a field electrode (61) between them at a relatively high (negative) potential sufficient to provide focusing of the ion beam at the first electrode. The first electrode is larger than the beam to avoid deflecting ions at the periphery of the aperture out of the beam. The first electrode has an aperture which is smaller than that of the field electrode. The field electrode is at least -5 kV relative to the flight tube, that is substantially more than required for electron suppression. Additional apertures are provided between the process chamber and the mass selection chamber to improve evacuation.
Public/Granted literature
- US5264420A Fibrinogen receptor antagonists Public/Granted day:1993-11-23
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