Invention Grant
- Patent Title: Infrared sensor and manufacturing method thereof
- Patent Title (中): 红外线传感器及其制造方法
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Application No.: US09819596Application Date: 2001-03-29
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Publication No.: US06573504B2Publication Date: 2003-06-03
- Inventor: Yoshinori Iida , Keitaro Shigenaka , Naoya Mashio
- Applicant: Yoshinori Iida , Keitaro Shigenaka , Naoya Mashio
- Priority: JP2000-095687 20000330
- Main IPC: G01J520
- IPC: G01J520

Abstract:
An object of the present invention is to provide a high-sensitivity infrared sensor. According to the present invention, a support member for supporting a sensor portion in a cavity structure is formed to be remarkably thin as compared with a conventional structure, a sectional area of the support member is considerably reduced, heat conductance can remarkably be reduced and, as a result, the infrared sensor having a remarkably high sensitivity can be obtained. Moreover, according to the present invention, since an insulating layer of a support member area is etched, and a sacrifice silicon film is embedded in the area, an aspect ratio of an insulating layer RIE for forming a support leg is remarkably reduced. A manufacturing process is facilitated, a sectional area of the support leg is further reduced as a secondary effect, and the sensitivity of the infrared sensor can further be enhanced.
Public/Granted literature
- US20010028035A1 Infrared sensor and manufacturing method thereof Public/Granted day:2001-10-11
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