• Patent Title: Apparatus for optical inspection of a working surface having a dynamic reflective spatial attenuator
  • Application No.: US09905839
    Application Date: 2001-07-13
  • Publication No.: US06643007B2
    Publication Date: 2003-11-04
  • Inventor: Tuan Le
  • Applicant: Tuan Le
  • Main IPC: G01N2100
  • IPC: G01N2100
Apparatus for optical inspection of a working surface having a dynamic reflective spatial attenuator
Abstract:
A dynamic reflective spatial attenuator for use in an optical inspection apparatus. The attenuator takes the form of a two-dimensional micro-mechanical reflective array that, in the first operative position of a mirror element, reflects the desired scattered light toward a detector and, in the second operative position of a mirror element, reflects undesired scattered light into a light dump. The mirror array's fast response and flexibility allows for changes during mid-scan to increase the defect's or contaminant's signal relative to the substrate surface's signal.
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