Invention Grant
US06690465B2 Method and apparatus for measuring spectral irradiance distribution
有权
用于测量光谱辐照度分布的方法和装置
- Patent Title: Method and apparatus for measuring spectral irradiance distribution
- Patent Title (中): 用于测量光谱辐照度分布的方法和装置
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Application No.: US09752397Application Date: 2001-01-03
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Publication No.: US06690465B2Publication Date: 2004-02-10
- Inventor: Masayoshi Shimizu , Masahiro Mori , Shoji Suzuki
- Applicant: Masayoshi Shimizu , Masahiro Mori , Shoji Suzuki
- Priority: JP2000-067517 20000310
- Main IPC: G01J340
- IPC: G01J340

Abstract:
In measuring a spectral irradiance distribution of light, light is irradiated to n (natural number) light-transit sections, which respectively have n kinds of given optical characteristic coefficients, and s (natural number) optical sensors, which respectively have s kinds of given spectral sensitivities, receive the light via the n light-transit sections and detects individual responses for the received light. Then a calculating section calculates m (natural number) spectral irradiances for m kinds of wavelengths as a spectral irradiance distribution based on linear formulae established between the optical characteristic coefficients, the spectral sensitivities, (n×s) responses for the light obtained by the s optical sensors, and the spectral irradiance distribution of the light.
Public/Granted literature
- US20010024274A1 Method and apparatus for measuring spectral irradiance distribution Public/Granted day:2001-09-27
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