Invention Grant
- Patent Title: Particle size distribution measuring apparatus with validation and instruction modes
- Patent Title (中): 具有验证和指令模式的粒度分布测量仪器
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Application No.: US09858389Application Date: 2001-05-16
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Publication No.: US06741350B2Publication Date: 2004-05-25
- Inventor: Hideyuki Ikeda , Seiichiro Yoshioka
- Applicant: Hideyuki Ikeda , Seiichiro Yoshioka
- Priority: JP2000-142963 20000516
- Main IPC: G01N1502
- IPC: G01N1502

Abstract:
This invention provides a particle size distribution measuring apparatus, which has a function of informing an operator of a procedure of validation work of the particle size distribution measuring apparatus. A storage medium which records validation data providing a procedure of validation work for the particle size distribution measuring apparatus and a control unit which has a validation help function which successively reads a validation procedure from the validation data and controls the particle size distribution measuring apparatus according to a measuring procedure without any operation by an operator in the validation procedure while teaching the operator a work procedure requiring an operation by the operator.
Public/Granted literature
- US20010048366A1 Particle size distribution measuring apparatus with validation and instruction modes Public/Granted day:2001-12-06
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