- Patent Title: Method of detecting polarity reversal in a magnetoresistive sensor
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Application No.: US10632768Application Date: 2003-08-01
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Publication No.: US06965229B2Publication Date: 2005-11-15
- Inventor: Shanlin Duan , Yan Liu , Li Tang
- Applicant: Shanlin Duan , Yan Liu , Li Tang
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Agent Matthew S. Zises; Lewis L. Nunnelley
- Main IPC: G11B5/00
- IPC: G11B5/00 ; G11B5/012 ; G11B5/455 ; G11B5/82 ; G11B27/36 ; G01R33/12
Abstract:
A method is provided for testing a magnetoresistive sensor for polarity reversal. In one embodiment, the method includes: writing a test pattern on a magnetic disk; providing a mechanical or thermal stress to the magnetoresistive sensor for a period of time; and, comparing the polarity of the test pattern before and after the application of stress.
Public/Granted literature
- US20050024046A1 Method of detecting polarity reversal in a magnetoresistive sensor Public/Granted day:2005-02-03
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