Invention Grant
- Patent Title: Optical spectrum analyzer and optical spectrum detecting method
- Patent Title (中): 光谱分析仪和光谱检测方法
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Application No.: US10720146Application Date: 2003-11-25
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Publication No.: US06972839B2Publication Date: 2005-12-06
- Inventor: Takeo Iwama
- Applicant: Takeo Iwama
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2001-076433 20010316
- Main IPC: G01J3/12
- IPC: G01J3/12 ; G01J3/28

Abstract:
In an optical spectrum analyzer comprising a spectrograph and a photodevice array, and an optical spectrum detecting method, a wavelength deviation, from an assigned wavelength, of a light detected by a photodevice array which detects a wavelength of a diffraction light or a non-diffraction light from an acoustooptic device, is detected and a feedback control to a diffraction angle of the acoustooptic device is performed. Also, without using a feedback control, an exit light and a diffraction light from the acoustooptic device are respectively received by two photodevice arrays and the photodevices are arranged in order to mutually compensate gaps between the photodevices, whereby a center of each photodevice is similarly made coincide with a peak of an optical beam to be received.
Public/Granted literature
- US20040075832A1 Optical spectrum analyzer and optical spectrum detecting method Public/Granted day:2004-04-22
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