Invention Grant
- Patent Title: Scanning microscope and coupling-out element
- Patent Title (中): 扫描显微镜和耦合元件
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Application No.: US10766260Application Date: 2004-01-27
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Publication No.: US06977773B2Publication Date: 2005-12-20
- Inventor: Johann Engelhardt , Werner Knebel , Heinrich Ulrich
- Applicant: Johann Engelhardt , Werner Knebel , Heinrich Ulrich
- Applicant Address: DE Mannheim
- Assignee: Leica Microsystems Heidelberg GmbH
- Current Assignee: Leica Microsystems Heidelberg GmbH
- Current Assignee Address: DE Mannheim
- Agency: Davidson, Davidson & Kappel, LLC
- Priority: DE10120424 20010426
- Main IPC: G02B21/00
- IPC: G02B21/00

Abstract:
A scanning microscope has a light source that emits illuminating light for illumination of a specimen, at least one first detector for detection of the detected light proceeding from the specimen, an objective arranged in both an illumination beam path and a detection beam path, and a coupling-out element that is selectably for descan detection and non-descan detection positionable in the illumination and detection beam path. A light-guiding fiber is provided for transporting at least a portion of the detection light from the coupling-out element to the first detector.
Public/Granted literature
- US20040190133A1 Scanning microscope and coupling-out element Public/Granted day:2004-09-30
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