Invention Grant
- Patent Title: Optical sampling waveform measuring apparatus
- Patent Title (中): 光采样波形测量装置
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Application No.: US10228607Application Date: 2002-08-27
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Publication No.: US06980290B2Publication Date: 2005-12-27
- Inventor: Hiroshi Ohta , Makoto Yoshida
- Applicant: Hiroshi Ohta , Makoto Yoshida
- Applicant Address: JP Tokyo
- Assignee: Yokogawa Electric Corporation
- Current Assignee: Yokogawa Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Cohen, Pontani, Lieberman & Pavane
- Priority: JP2001-258008 20010828
- Main IPC: G01J11/00
- IPC: G01J11/00 ; G02F1/35 ; G02F1/37 ; G01J1/00
Abstract:
An optical sampling waveform measuring apparatus can measure waveform of a high-speed signal light P8 sensitively, accurately, and in high time resolution, Raman shift light which is generated from a light pulse having a narrower pulse width than the signal light to be measured is used as a sampling light pulse.
Public/Granted literature
- US20030043366A1 Optical sampling waveform measuring apparatus Public/Granted day:2003-03-06
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