Invention Grant
- Patent Title: Detection of slider-disk interference using a dynamic parametric test
- Patent Title (中): 使用动态参数测试检测滑块盘干扰
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Application No.: US10342780Application Date: 2003-01-14
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Publication No.: US06989671B2Publication Date: 2006-01-24
- Inventor: Li-Yan Zhu , Xiaofeng Zhang , Yen Fu , Ellis T. Cha
- Applicant: Li-Yan Zhu , Xiaofeng Zhang , Yen Fu , Ellis T. Cha
- Applicant Address: HK Hong Kong
- Assignee: SAE Magnetics (H.K.) Ltd.
- Current Assignee: SAE Magnetics (H.K.) Ltd.
- Current Assignee Address: HK Hong Kong
- Agency: Kenyon & Kenyon
- Main IPC: G01R33/12
- IPC: G01R33/12
Abstract:
A method is described for calculating head disk interference (HDI) using a dynamic parametric test. In one embodiment, HDI is calculated based on an actual and ideal sensitivity profile based on a read-back signal track profile for the slider/head.
Public/Granted literature
- US20040135575A1 Detection of slider-disk interference using a dynamic parametric test Public/Granted day:2004-07-15
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