Invention Grant
- Patent Title: Birefringence measurement of large-format samples
- Patent Title (中): 大幅面样品的双折射测量
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Application No.: US10359529Application Date: 2003-02-05
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Publication No.: US06992758B2Publication Date: 2006-01-31
- Inventor: Andrew D. Kaplan , James C. Mansfield , Douglas C. Mark
- Applicant: Andrew D. Kaplan , James C. Mansfield , Douglas C. Mark
- Applicant Address: US OR Hillsboro
- Assignee: Hinds Instruments, INC
- Current Assignee: Hinds Instruments, INC
- Current Assignee Address: US OR Hillsboro
- Agency: Ipsolon LLP
- Main IPC: G01N21/01
- IPC: G01N21/01

Abstract:
The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.
Public/Granted literature
- US20040075834A1 Birefringence measurement of large-format samples Public/Granted day:2004-04-22
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