Invention Grant
- Patent Title: Detector configurations for optical metrology
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Application No.: US10985494Application Date: 2004-11-10
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Publication No.: US06995842B2Publication Date: 2006-02-07
- Inventor: Jon Opsal
- Applicant: Jon Opsal
- Applicant Address: US CA Fremont
- Assignee: Therma-Wave, Inc.
- Current Assignee: Therma-Wave, Inc.
- Current Assignee Address: US CA Fremont
- Agency: Stallman & Pollock LLP
- Main IPC: G01N11/06
- IPC: G01N11/06

Abstract:
An apparatus is disclosed for obtaining ellipsometric measurements from a sample. A probe beam is focused onto the sample to create a spread of angles of incidence. The beam is passed through a quarter waveplate retarder and a polarizer. The reflected beam is measured by a detector. In one preferred embodiment, the detector includes eight radially arranged segments, each segment generating an output which represents an integration of multiple angle of incidence. A processor manipulates the output from the various segments to derive ellipsometric information.
Public/Granted literature
- US20050105089A1 Detector configurations for optical metrology Public/Granted day:2005-05-19
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