Invention Grant
- Patent Title: Lithographic apparatus and device manufacturing method
- Patent Title (中): 平版印刷设备和器件制造方法
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Application No.: US10738129Application Date: 2003-12-18
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Publication No.: US07023524B2Publication Date: 2006-04-04
- Inventor: Antonius Johannes Josephus Van Dijsseldonk , Marcel Mathijs Theodore Marie Dierichs , Harm-Jan Voorma
- Applicant: Antonius Johannes Josephus Van Dijsseldonk , Marcel Mathijs Theodore Marie Dierichs , Harm-Jan Voorma
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman, LLP
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/72

Abstract:
A lithographic apparatus including a radiation attenuator or a variable aperture system, such as masking blades, arranged in or adjacent an intermediate focus of the projection system. Besides a radiation attenuator or a variable aperture system, a measuring system may be arranged in the intermediate focus. By placing one or more of such systems in or adjacent the intermediate focus of the projection system, instead of adjacent the reticle in the illumination system, fewer design restrictions occur because of more space available, resulting in a lower design cost.
Public/Granted literature
- US20050134818A1 Lithographic apparatus and device manufacturing method Public/Granted day:2005-06-23
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