Invention Grant
- Patent Title: Electron beam apparatus and method for production of its specimen chamber
-
Application No.: US10742901Application Date: 2003-12-23
-
Publication No.: US07030376B2Publication Date: 2006-04-18
- Inventor: Tsuyoshi Inanobe , Sho Takami , Yoichi Ose , Katsuhiro Sasada
- Applicant: Tsuyoshi Inanobe , Sho Takami , Yoichi Ose , Katsuhiro Sasada
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Dickstein Shapiro Morin & Oshinsky LLP
- Priority: JP2003-001684 20030108
- Main IPC: G01N23/00
- IPC: G01N23/00

Abstract:
A structure of an electron beam apparatus having shielding properties for shielding against an environmental magnetic field is provided. The electron beam apparatus comprises a mirror barrel for housing a magnetic lens for converging an electron beam onto a specimen and a specimen chamber for housing the specimen, wherein a non-magnetic material having conductivity is used as a material for at least one of the mirror barrel and a main body of the specimen chamber. The material for the mirror barrel or the main body of the specimen chamber is an aluminum alloy and a thickness of a sidewall of the mirror barrel or the main body of the specimen chamber is 10 mm or more. A magnetic plate having a thickness smaller than that of the sidewall of the mirror barrel or the main body of the specimen chamber is provided on an inner sidewall of the mirror barrel or the main body of the specimen chamber.
Public/Granted literature
- US20040135082A1 Electron beam apparatus and method for production of its specimen chamber Public/Granted day:2004-07-15
Information query