Invention Grant
- Patent Title: Double confocal scanning microscope
- Patent Title (中): 双共焦扫描显微镜
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Application No.: US09826712Application Date: 2001-04-05
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Publication No.: US07054062B2Publication Date: 2006-05-30
- Inventor: Johann Engelhardt , Jörg Bewersdorf , Hilmar Gugel , Juergen Hoffmann
- Applicant: Johann Engelhardt , Jörg Bewersdorf , Hilmar Gugel , Juergen Hoffmann
- Applicant Address: DE Mannheim
- Assignee: Leica Microsystems Heidelberg GmbH
- Current Assignee: Leica Microsystems Heidelberg GmbH
- Current Assignee Address: DE Mannheim
- Agency: Houston Eliseeva LLP
- Priority: DE10018256 20000413
- Main IPC: G02B21/06
- IPC: G02B21/06 ; G02B21/00

Abstract:
The present invention concerns a double confocal scanning microscope (1) having an illuminating beam path (2) of at least one light source (3), and a detected beam path (4) of at least one detector (5), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components (6, 10, 13, 14) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.
Public/Granted literature
- US20010030803A1 Double confocal scanning microscope Public/Granted day:2001-10-18
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