Invention Grant
US07054205B2 Circuit and method for determining integrated circuit propagation delay
有权
用于确定集成电路传播延迟的电路和方法
- Patent Title: Circuit and method for determining integrated circuit propagation delay
- Patent Title (中): 用于确定集成电路传播延迟的电路和方法
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Application No.: US10695317Application Date: 2003-10-28
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Publication No.: US07054205B2Publication Date: 2006-05-30
- Inventor: Douglas C. Buhler , John Howard Cook, III
- Applicant: Douglas C. Buhler , John Howard Cook, III
- Applicant Address: US CA Palo Alto
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Palo Alto
- Main IPC: H03K17/296
- IPC: H03K17/296 ; G11O17/28 ; H04J3/06

Abstract:
A circuit and method is provided for determining the delay of an integrated circuit common associated with chip-to-chip variations in the manufacturing process, changes in operating voltage, and fluctuations in temperature. A clock signal is inverted, thus generating an inverted clock signal which is then delayed multiple times, resulting in several delayed versions of the inverted clock signal, with each version being delayed a different length of time. The logical state of each delayed version of the inverted clock signal is then stored. That stored logical state provides an indication as to the magnitude of the delay of the integrated circuit which may then be used to tune critical signals of the integrated circuit to avoid timing problems resulting from variations in IC propagation delay.
Public/Granted literature
- US20050088883A1 Circuit and method for determining integrated circuit propagation delay Public/Granted day:2005-04-28
Information query
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