Invention Grant
- Patent Title: Measuring wavelength change
- Patent Title (中): 测量波长变化
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Application No.: US10275119Application Date: 2001-05-01
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Publication No.: US07061609B2Publication Date: 2006-06-13
- Inventor: Lun Kai Cheng
- Applicant: Lun Kai Cheng
- Applicant Address: NL Delft
- Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO
- Current Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO
- Current Assignee Address: NL Delft
- Agency: Young & Thompson
- Priority: WOPCT/NL00/00281 20000501
- International Application: PCT/NL01/00327 WO 20010501
- International Announcement: WO01/84097 WO 20011108
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
An optical wavelength analyser including: an entrance slit (4) for receiving a light beam (3) including signals with various wavelengths and passing the beam at least partly; a diffractor (6, 7, 9) for receiving the passed beam and diffracting the signals dependent on their wavelength; a detector (8) including adjacent detector elements (32, 33, 35, 36, 38, 39) for receiving the diffracted signals and generating their output signals; a processor (21) for determining the wavelengths from the output signals, in which the received light beam has a spatially uniform intensity; the diffractor diffracts each signal on a different detector element subset, consisting of at least a first element (32, 33, 35, 36, 38, 39.) for receiving at least a first signal with a first signal level; the processor determines each signal's wavelength dependent on the first signal level and a calibration value.
Public/Granted literature
- US20030156287A1 Measuring weavelength change Public/Granted day:2003-08-21
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