Invention Grant
- Patent Title: Parametric outlier detection
- Patent Title (中): 参数异常值检测
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Application No.: US10928292Application Date: 2004-08-27
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Publication No.: US07062415B2Publication Date: 2006-06-13
- Inventor: Bruce J. Whitefield , David A. Abercrombie , David R. Turner , James N. McNames
- Applicant: Bruce J. Whitefield , David A. Abercrombie , David R. Turner , James N. McNames
- Applicant Address: US CA Milpitas
- Assignee: LSI Logic Corporation
- Current Assignee: LSI Logic Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Luedeka, Neely & Graham, P.C.
- Main IPC: G06F17/00
- IPC: G06F17/00

Abstract:
A method for determining outlier data points in. A subset of dataset patterns is selected from a set of mathematical dataset patterns, and the subset of dataset patterns is combined into a composite dataset. The composite dataset is compared to the dataset, and a degree of correlation between the composite dataset and the dataset is determined. Data points within the composite dataset are selectively weighted to improve the degree of correlation, and the steps described above are selectively iteratively repeated until the degree of correlation is at least a desired value. Residuals for the data points within the composite dataset are selectively determined. At least one of the weighted data points within the composite dataset that are weighted within a first specified range, and data points within the composite dataset that have a residual within a second specified range, are selectively output as outlier data points.
Public/Granted literature
- US20060047485A1 Parametric outlier detection Public/Granted day:2006-03-02
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