Invention Grant
- Patent Title: Method for determining power of modulated signals from a frequency transformed interferogram
- Patent Title (中): 用于从频率变换干涉图确定调制信号的功率的方法
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Application No.: US10080845Application Date: 2002-02-22
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Publication No.: US07102755B1Publication Date: 2006-09-05
- Inventor: David M Braun , Misty J Mesel
- Applicant: David M Braun , Misty J Mesel
- Applicant Address: US CA Palo Alto
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Palo Alto
- Agent John L. Imperato
- Main IPC: G01B9/02
- IPC: G01B9/02 ; H04J1/16

Abstract:
A method determines power of a modulated signal that is applied to a wavelength meter by summing bin values within a designated bin range of a frequency transformed interferogram representing the modulated signal and provided by the wavelength meter. In a first embodiment of the method, the bin range within which the bin values are summed is designated by mapping a series of signal characteristics indicative of the types of the modulated signals applied to the wavelength meter, to a series of bin spans within the frequency transformed interferograms that represent the modulated signals. The method then enables a selection of a signal characteristic from the series of signal characteristics to identify the modulated signal that is applied to the wavelength meter. In response to a selection, the bin values are summed within a bin range that is consistent with the mapping of the series of signal characteristics to the series of bin spans and that is positioned about a center bin of the frequency transformed interferogram. In a second embodiment of the method, the bin range within which bin values are summed is designated automatically based on attributes of the frequency transformed interferogram.
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