Invention Grant
US07109121B2 Stress control of semiconductor microstructures for thin film growth
有权
用于薄膜生长的半导体微结构的应力控制
- Patent Title: Stress control of semiconductor microstructures for thin film growth
- Patent Title (中): 用于薄膜生长的半导体微结构的应力控制
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Application No.: US10876140Application Date: 2004-06-24
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Publication No.: US07109121B2Publication Date: 2006-09-19
- Inventor: Amit Lal , Max G. Lagally , Chung Hoon Lee , Paul Powell Rugheimer
- Applicant: Amit Lal , Max G. Lagally , Chung Hoon Lee , Paul Powell Rugheimer
- Applicant Address: US WI Madison
- Assignee: Wisconsin Alumni Research Foundation
- Current Assignee: Wisconsin Alumni Research Foundation
- Current Assignee Address: US WI Madison
- Agency: Foley & Lardner LLP
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A method of forming a suspended semiconductor film is provided comprising providing a semiconductor structure including a layer of semiconductor film over a sacrificial layer, the semiconductor film secured to a substrate; depositing a film of material over the semiconductor film that has a tensile or compressive strain with respect to the semiconductor film patterning the deposited film to leave opposed segments spaced from each other by a central portion of the semiconductor film; patterning the semiconductor film and removing the sacrificial layer beneath the semiconductor film to leave a semiconductor film section anchored to the substrate at at least two anchor positions, with the film segments remaining on the semiconductor film adjacent to the anchor positions and spaced from each other by the central position of the suspended semiconductor film such that the film segments apply a tensile or compressive stress to the suspended semiconductor film.
Public/Granted literature
- US20040232504A1 Stress control of semiconductor microstructures for thin film growth Public/Granted day:2004-11-25
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