Invention Grant
US07130379B2 Device and method for generating an x-ray point source by geometric confinement
有权
通过几何约束生成X射线点源的装置和方法
- Patent Title: Device and method for generating an x-ray point source by geometric confinement
- Patent Title (中): 通过几何约束生成X射线点源的装置和方法
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Application No.: US10445856Application Date: 2003-05-28
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Publication No.: US07130379B2Publication Date: 2006-10-31
- Inventor: Hendrik F. Hamann , Yves Martin , Theodore G. van Kessel , Hemantha K. Wickramasinghe
- Applicant: Hendrik F. Hamann , Yves Martin , Theodore G. van Kessel , Hemantha K. Wickramasinghe
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: McGinn IP Law Group PLLC
- Agent Stephen C. Kaufman, Esq.
- Main IPC: H01J35/08
- IPC: H01J35/08
Abstract:
A device for generating an x-ray point source includes a target, and an electron source for producing electrons which intersect with the target to generate an x-ray point source having a size which is confined by a dimension of the target.
Public/Granted literature
- US20040240613A1 Device and method for generating an x-ray point source by geometric confinement Public/Granted day:2004-12-02
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