Invention Grant
US07205659B2 Assemblies for temporarily connecting microelectronic elements for testing and methods therefor
有权
用于临时连接用于测试的微电子元件的组件及其方法
- Patent Title: Assemblies for temporarily connecting microelectronic elements for testing and methods therefor
- Patent Title (中): 用于临时连接用于测试的微电子元件的组件及其方法
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Application No.: US10777804Application Date: 2004-02-12
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Publication No.: US07205659B2Publication Date: 2007-04-17
- Inventor: Masud Beroz , David Light
- Applicant: Masud Beroz , David Light
- Applicant Address: US CA San Jose
- Assignee: Tessera, Inc.
- Current Assignee: Tessera, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Main IPC: H01L23/48
- IPC: H01L23/48

Abstract:
A microelectronic assembly includes a first microelectronic element having a contact bearing face and at least one contact accessible at the contact bearing face, and a second microelectronic element opposing the first microelectronic element, the second microelectronic element having a first surface including at least one lead extending over the first surface. The microelectronic assembly includes the first fusible material engaging the at least one contact of the first microelectronic element, and a second fusible material engaging the at least one lead, whereby one of the first and second fusible materials has a higher melting temperature and one of the first and second fusible materials has a lower melting temperature. The first and second microelectronic elements are juxtaposed with one another so that the first and second fusible materials are in substantial alignment with one another, with one of the first and second fusible materials in a liquid state and one of the first and second fusible materials in a solid state.
Public/Granted literature
- US20040159959A1 Assemblies for temporarily connecting microelectronic elements for testing and methods therefor Public/Granted day:2004-08-19
Information query
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