Invention Grant
- Patent Title: Method and apparatus for implement XANES analysis
- Patent Title (中): 用于实施XANES分析的方法和装置
-
Application No.: US11291349Application Date: 2005-12-01
-
Publication No.: US07206375B2Publication Date: 2007-04-17
- Inventor: Zewu Chen , Walter Gibson
- Applicant: Zewu Chen , Walter Gibson
- Applicant Address: US NY East Greenbush
- Assignee: X-Ray Optical Systems, Inc.
- Current Assignee: X-Ray Optical Systems, Inc.
- Current Assignee Address: US NY East Greenbush
- Agency: Heslin Rothenberg Farley & Mesiti, P.C.
- Agent Jeffrey R. Klembczyk, Esq.; Kevin P. Radigan, Esq.
- Main IPC: G01F23/06
- IPC: G01F23/06

Abstract:
Compact, low-power-consuming systems and methods for exposing samples to high-energy radiation, for example, for exposing samples to x-rays for implementing x-ray absorption near edge analysis (XANES). The systems and methods include a low-power-consuming radiation source, such as an x-ray tube; one or more tunable crystal optics for directing and varying the energy of the radiation onto a sample under analysis; and a radiation detecting device, such as an x-ray detector, for detecting radiation emitted by the sample. The one or more tunable crystal optics may be doubly-curved crystal optics. The components of the system may be arranged in a collinear fashion. The disclosed systems and methods are particularly applicable to XANES analysis, for example, XANES analysis of the chemical state of chromium or another transition metal in biological processes.
Public/Granted literature
- US20060120508A1 Method and apparatus for implement XANES analysis Public/Granted day:2006-06-08
Information query