Invention Grant
- Patent Title: Non-visible radiation imaging and inspection
- Patent Title (中): 不可见的辐射成像和检查
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Application No.: US11121827Application Date: 2005-05-04
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Publication No.: US07208733B2Publication Date: 2007-04-24
- Inventor: Zahid F. Mian , Jeremy C. Mullaney , Ryk E. Spoor
- Applicant: Zahid F. Mian , Jeremy C. Mullaney , Ryk E. Spoor
- Applicant Address: US NY Albany
- Assignee: International Electronic Machines Corp.
- Current Assignee: International Electronic Machines Corp.
- Current Assignee Address: US NY Albany
- Agency: Hoffman, Warnick & D'Alessandro LLC
- Main IPC: G01J5/00
- IPC: G01J5/00
Abstract:
A non-visible radiation imaging system is provided in which an image is obtained based on non-visible radiation of an object. The image can be enhanced to increase its resolution. Additionally, the image can be combined with another image based on visible light for the object. Further, a non-visible radiation inspection system and method are provided that perform an inspection of the object using one or more of the images.
Public/Granted literature
- US20060043296A1 Non-visible radiation imaging and inspection Public/Granted day:2006-03-02
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