Invention Grant
- Patent Title: Measuring and adjustment device for an alignment optical system and adjustment method thereof
- Patent Title (中): 一种对准光学系统的测量和调节装置及其调整方法
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Application No.: US11326434Application Date: 2006-01-06
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Publication No.: US07250597B2Publication Date: 2007-07-31
- Inventor: Hiroshi Aoki
- Applicant: Hiroshi Aoki
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff & Berridge, PLC
- Priority: JP2005-004499 20050111
- Main IPC: G02B6/26
- IPC: G02B6/26 ; G01J1/10

Abstract:
Avoiding an illumination light irregularity to the utmost under increasing degree of integration and the memory capacity by suppressing a light amount irregularity on the illumination pupil plane to the utmost, unable to be adjusted by a conventional method. When the light amount irregularity on the illumination pupil plane which is the exit surface of the optical fiber is relatively large, focus of the imaging surface of the CCD camera is switched from the sample to the illumination pupil plane by a focus switching lens. The light amount irregularity is calculated and analyzed by the image processor. Based on the analyzed result, the exit surface position of the optical fiber is adjusted in the illumination optical system. In this manner, the illumination pupil plane which is the exit surface of the optical fiber can be adjusted to an illumination pupil plane where the light amount irregularity is small.
Public/Granted literature
- US20060151679A1 Measuring device and adjustment method thereof Public/Granted day:2006-07-13
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