Invention Grant
- Patent Title: Providing electrical contact to the surface of a semiconductor workpiece during processing
- Patent Title (中): 在加工期间向半导体工件的表面提供电接触
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Application No.: US10459321Application Date: 2003-06-10
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Publication No.: US07309413B2Publication Date: 2007-12-18
- Inventor: Homayoun Talieh , Cyprian Uzoh , Bulent M. Basol
- Applicant: Homayoun Talieh , Cyprian Uzoh , Bulent M. Basol
- Applicant Address: US CA San Jose
- Assignee: Novellus Systems, Inc.
- Current Assignee: Novellus Systems, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: C25D5/04
- IPC: C25D5/04 ; C25D7/12 ; C25F3/12

Abstract:
Substantially uniform deposition of conductive material on a surface of a substrate, which substrate includes a semiconductor wafer, from an electrolyte containing the conductive material can be provided by way of a particular device which includes first and second conductive elements. The first conductive element can have multiple electrical contacts, of identical or different configurations, or may be in the form of a conductive pad, and can contact or otherwise electrically interconnect with the substrate surface over substantially all of the substrate surface. Upon application of a potential between the first and second conductive elements while the electrolyte makes physical contact with the substrate surface and the second conductive element, the conductive material is deposited on the substrate surface. It is possible to reverse the polarity of the voltage applied between the anode and the cathode so that electro-etching of deposited conductive material can be performed.
Public/Granted literature
- US20030209445A1 Device providing electrical contact to the surface of a semiconductor workpiece during processing Public/Granted day:2003-11-13
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