Invention Grant
US07355186B2 Charged particle beam device with cleaning unit and method of operation thereof
有权
具有清洁单元的带电粒子束装置及其操作方法
- Patent Title: Charged particle beam device with cleaning unit and method of operation thereof
- Patent Title (中): 具有清洁单元的带电粒子束装置及其操作方法
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Application No.: US10547865Application Date: 2004-03-03
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Publication No.: US07355186B2Publication Date: 2008-04-08
- Inventor: Thomas Jasinski
- Applicant: Thomas Jasinski
- Applicant Address: DE Heimstetten
- Assignee: ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Current Assignee: ICT, Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Current Assignee Address: DE Heimstetten
- Agency: Patterson & Sheridan, LLP
- Priority: EP03004665 20030303
- International Application: PCT/EP2004/002140 WO 20040303
- International Announcement: WO2004/079770 WO 20040916
- Main IPC: G21G5/00
- IPC: G21G5/00 ; A61N5/00

Abstract:
The invention provides a charged particle beam device, an emitter module for emitting charged particle beams and a method of operation thereof. Thereby, a charged particle beam emitter (15) emitting charged particles along an optical axis (1) is realized. On the same carrier body (32), a cleaning emitter (16) for emitting charged particles approximately along the optical axis (1) is realized. Thus, an improved cleaning can be provided.
Public/Granted literature
- US20060231772A1 Charged particle beam device with cleaning unit and method of operation thereof Public/Granted day:2006-10-19
Information query
IPC分类:
G | 物理 |
G21 | 核物理;核工程 |
G21G | 化学元素的转变;放射源 |
G21G5/00 | 通过化学反应进行化学元素的推断转变 |