Invention Grant
- Patent Title: Apparatus for and method of measuring clock skew
- Patent Title (中): 仪器和测量时钟偏移的方法
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Application No.: US11585526Application Date: 2006-10-23
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Publication No.: US07356109B2Publication Date: 2008-04-08
- Inventor: Takahiro Yamaguchi , Masahiro Ishida , Mani Soma
- Applicant: Takahiro Yamaguchi , Masahiro Ishida , Mani Soma
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Gallagher & Lathrop
- Agent David N. Lathrop, Esq.
- Main IPC: H04L7/00
- IPC: H04L7/00

Abstract:
Timing jitter sequences Δφj[n] and Δφk[n] of respective clock signals under measurement xj(t) and xk(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles φ0j and φ0k of linear instantaneous phases of the xj(t) and xk(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the xj(t) and xk(t).
Public/Granted literature
- US20070036256A1 Apparatus for and method of measuring clock skew Public/Granted day:2007-02-15
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